中图分类号：TN407
文献标志码：A
DOI: 10.16157/j.issn.0258-7998.223168
中文引用格式：张梅娟，辛昆鹏，王丽娟，等. 基于JTAG的高效调试系统设计与实现[J]. 电子技术应用，2023，49(4)：39-43.
英文引用格式：Zhang Meijuan，Xin Kunpeng，Wang Lijuan，et al. Design and implementation of high performance debugging system based on JTAG[J]. Application of Electronic Technique，2023，49(4)：39-43.
Design and implementation of high performance debugging system based on JTAG
Zhang Meijuan，Xin Kunpeng，Wang Lijuan，Deng Jiawei
(The Fifty-Eighth Research Institute of China Electronic Technology Group Corporation， Wuxi 214063， China)
Abstract：A debugging system based on JTAG interface is proposed in this paper to provide an effective and convenient debugging method for domestic processor chip. The debugging system, which is based on JTAG standard, simplifies the design of the on-chip debugging hardware module. With little hardware overhead, simple and high performance design of the debugging instruction, it is used to realize the debugging interrupt, breakpoint and watch point setting，single step running，register or memory read and write, and other base debugging functions, as well as sence protection and recovery, trace buffer, instruction insert execution and other advanced debugging functions. After passed the actual chip testing, the debugging system has compatibility with JTAG protocol, comprehensive functions, high performance, simple structure, convenient for operation and other features.
Key words :debugging system；JTAG protocol；IEEE1149.1；TAP control
片上调试(On-Chip Debugging，OCD)是目前应用最广泛的一种芯片调试技术，它是一种在芯片内部提供相应调试功能模块的调试技术，目前最流行的OCD技术是JTAG技术。联合测试行动小组(Joint Test Action Group，JTAG)是一种国际标准测试协议IEEE1149.1，主要作用是完成芯片内部测试。它具有灵活高效、易于实现等优点，是目前使用最为广泛的调试技术，大规模应用在各种处理器芯片中。
